Defect detection in aluminum foil by input-estimate-based chi-square detector

Ming Zhai; Zhongliang Jing; Shan Fu; Xinbin Luo

doi:10.1117/1.3258433

1 November 2009 Defect detection in aluminum foil by input-estimate-based chi-square detector

Ming Zhai, Zhongliang Jing, Shan Fu, Xinbin Luo

Author Affiliations +

Optical Engineering, Vol. 48, Issue 11, 119701 (November 2009). https://doi.org/10.1117/1.3258433

Abstract

Quality inspection of aluminum foil products plays an important role for aluminum foil manufactures. We present a method that uses input estimate (IE)-based chi-square detectors for defect detection in aluminum foil. It is assumed that the intensity of the aluminum foil image is Gaussian distributed, and the distribution of the defect intensity is different from the normal. Under these assumptions, Kalman filters with a constant velocity (CV) model are used to filter the image. We assume there is an unknown input in the CV model and the unknown input is estimated in the filtering process. The defects are determined by the chi-square test of the estimate of the unknown input. Experiments show that our technique is effective for most defects in aluminum foil.

©(2009) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Ming Zhai, Zhongliang Jing, Shan Fu, and Xinbin Luo "Defect detection in aluminum foil by input-estimate-based chi-square detector," Optical Engineering 48(11), 119701 (1 November 2009). https://doi.org/10.1117/1.3258433

Published: 1 November 2009

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