Reliability of 4.6-µm quantum cascade lasers under continuous-wave room-temperature operation

Feng Xie; Catherine G. Caneau; Herve P. LeBlanc; Christopher A. Page; Satish C. Chaparala; Oberon D. Deichmann; Lawrence C. Hughes Jr.; Chung-En Zah

doi:10.1117/1.3498776

1 November 2010 Reliability of 4.6-µm quantum cascade lasers under continuous-wave room-temperature operation

Feng Xie, Catherine G. Caneau, Herve P. LeBlanc, Christopher A. Page, Satish C. Chaparala, Oberon D. Deichmann, Lawrence C. Hughes Jr., Chung-En Zah

Author Affiliations +

Optical Engineering, Vol. 49, Issue 11, 111104 (November 2010). https://doi.org/10.1117/1.3498776

Abstract

We report the life test results for 9 4.6-µm planar buried heterostructure quantum cascade lasers made of strain-balanced GaInAs/AlInAs/InP materials grown by metal organic vapor-phase epitaxy. No facet coating was deposited, and the devices were mounted on CuW submounts using AuSn solder. The aging condition is continuous wave operation at a heat-sink temperature of 22^ºC with a constant current of 0.85A, corresponding to current densities of 4.7 and 2.7 kA/cm², for lasers with widths of 4 and 7 µm, respectively. All lasers survived 5000 h aging, and most devices showed improved performance during the first 1000 h of aging.

©(2010) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Feng Xie, Catherine G. Caneau, Herve P. LeBlanc, Christopher A. Page, Satish C. Chaparala, Oberon D. Deichmann, Lawrence C. Hughes Jr., and Chung-En Zah "Reliability of 4.6-µm quantum cascade lasers under continuous-wave room-temperature operation," Optical Engineering 49(11), 111104 (1 November 2010). https://doi.org/10.1117/1.3498776

Published: 1 November 2010

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