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Dr. Abed C. Malti
at Univ d'Auvergne Clermont-Ferrand I
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Author
Publications (1)
SPIE Journal Paper | 28 September 2012
Magnification-continuous static calibration model of a scanning-electron microscope
Abed Malti, Sounkalo Dembélé, Nadine Le Fort-Piat, Patrick Rougeot, Roland Salut
JEI, Vol. 21, Issue 3, 033020, (September 2012) https://doi.org/10.1117/12.10.1117/1.JEI.21.3.033020
KEYWORDS: Distortion, Calibration, Scanning electron microscopy, 3D modeling, Microscopes, Visual process modeling, Personal digital assistants, Palladium, Imaging systems, Cameras
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