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Dr. Bernd Steffen
at Deutsches Elektronen-Synchrotron
SPIE Involvement:
Author
Publications (4)
Proceedings Article | 14 March 2023 Presentation + Paper
Advanced diagnostic detectors for rogue phenomena, single-shot applications
M. Caselle, S. Bielawski, S. Chilingaryan, M. K. Czwalinna, T. Dritschler, A. Kopmann, E. Kunakovskaya, O. Manzhura, S. Funkner, G. Niehues, M. Patil, E. Roussel, A. Santamaria Garcia, L. Scomparin, B. Steffen, J. Steinmann, C. Szwaj, E. Bründermann, A.-S. Müller, A. C. Ulusoy, M. Weber, S. Frank
Proceedings Volume 12406, 1240605 (2023) https://doi.org/10.1117/12.2657489
KEYWORDS: Terahertz radiation, Sensors, Ultrafast phenomena, Antennas, Data acquisition, Silicon, Artificial intelligence, Diagnostics, Pulse signals
Proceedings Article | 13 March 2023 Presentation
Single-shot time-domain spectrometers and THz digitizers using Diversity Electro-Optic Sampling (DEOS): principles and limitations
Eléonore Roussel, Christophe Szwaj, Clément Evain, Bernd Steffen, Christopher Gerth, Bahram Jalali, Serge Bielawski
Proceedings Volume PC12420, PC124200H (2023) https://doi.org/10.1117/12.2651884
KEYWORDS: Terahertz radiation, Electro optics, Spectrometers, Spectroscopy, Pulsed laser operation, Light emitting diodes, Laser beam diagnostics
Proceedings Article | 4 March 2019 Presentation + Paper
Ultra-fast detector for wide range spectral measurements
M. Caselle, E. Bründermann, S. Düsterer, S. Funkner, C. Gerth, D. Haack, A. Kopmann, M. Mahaveer Patil, D. Makowski, A. Mielczarek, Michael Nasse , G. Niehues, Lorenzo Rota, B. Steffen, W. Wang, M. Norbert Balzer, M. Weber, A. S. Müller, S. Bielawski
Proceedings Volume 10903, 1090306 (2019) https://doi.org/10.1117/12.2511341
KEYWORDS: Sensors, Field programmable gate arrays, Free electron lasers, Data processing, Electronics, Silicon, Synchrotrons, Analog electronics, Data acquisition, Diagnostics
Proceedings Article | 4 March 2019 Presentation
Single shot longitudinal electron bunch measurements with MHz repetition rate at the European x-ray FEL using electro-optical techniques (Conference Presentation)
Bernd Steffen, Christopher Gerth, Serge Bielawski, Christophe Szwaj, Michele Caselle, Lorenzo Rota, Dariusz Makowski, Aleksander Mielczarek
Proceedings Volume 10903, 1090308 (2019) https://doi.org/10.1117/12.2511673
KEYWORDS: X-rays, Free electron lasers, Electro optics, X-ray lasers, Femtosecond phenomena, Electro optical systems, Optical resolution, Sensors, Signal detection
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