Due to the instability of the conventional Hg1-xCdxTe alloy, the demand for barrier-based superlattice device structures for next-generation infrared photodetectors is rapidly growing. InAs1-xSbx, a Ga-free III–V ternary alloy, has the potential to show an advancement in the development of fourth-generation mid-wavelength infrared detectors. In this work, we develop an analytical, reliable simulation model to predict the dark current behavior of an nBn photodetector at various conditions and explain the physics of this new device structure to understand the operation of back-illuminated nBn photodetectors quantitatively. To provide the best possible performance, we consider InAs1-xSbx ternary alloy to design the absorber region due to its band gap tunability with Sb molar composition and favorable absorption characteristics. In order to complete the device design, InAsSb is used as a contact layer, and a lattice-matched, large-bandgap barrier layer of AlInAsSb is employed with the intent of minimizing diffusion current, depletion-region Shockley-Read-Hall (SRH) generation and leakage current in such devices. To construct the band structure of the considered heterostructure, we first determine the hole quasi-Fermi-level outside of the thermal equilibrium by solving the coupled equations for the electrostatic, carriers’ current continuity, and Poisson equations. Finally, we calculate the current-voltage characteristics to gain insight into the dominant mechanisms in the generation of dark current and demonstrate how the radiative and non-radiative processes affect the performance in relation to temperature and applied bias. In addition, we shed light on the performance of the considered photodetector by varying the depth of the contact and absorber regions. Our findings from the current device design show that the InAsSb/AlInAsSb-based nBn architecture may be a promising alternative for achieving high performance using a simplified device structure while circumventing issues related to the conventional material system, thereby serving as a basis for next-generation infrared detectors.
Photodetectors comprising of InAs/(In, Ga)Sb Type-II Superlattice (T2SL) structures demonstrate excellent performance over bulk detectors, which mainly includes tunable bandgap and controllable photo-absorption. The T2SL exhibits completely distinct properties from its constituent materials. In particular, the thickness of InAs and GaSb considered in one period of the T2SL plays a key role in determining its photoresponse. In this work, we compare two different compositions of the T2SL structure, which have similar bandgaps, in order to analyze their electronic band properties and miniband characteristics. For this, 12ML/12ML and 11ML/7ML T2SLs are examined which have a similar bandgap of 0.17eV corresponding to the wavelength of 7.2μm and the ratios of InAs-to-GaSb widths are approximately 1 and 1.5, respectively. The bandgap and density-of-states (DOS) masses are obtained by employing the k.p method within the envelope function approximation and the E-k dispersion both in the in-plane and the out-of-plane directions are analyzed. To further gain microscopic insights, we examine the carrier localization, miniband, and spectral current properties of finite T2SL structures using the Keldysh nonequilibrium Green’s function (NEGF) method. The spatial separation of electrons and holes in InAs and GaSb layers can be elucidated via the local density of states. Furthermore, a higher finite interband overlap between the first conduction band (C1) and the first heavy hole band (HH1) is observed in an 11ML/7ML T2SL which indicates a stronger absorption. Also, to predict the carrier transport in these structures, we incorporate scattering processes via the momentum dephasing model and note a lesser broadened dark current spectra in the 12ML/12ML T2SL structure. This suggests a stronger localization of carriers and as a consequence, the dark tunneling current will be indeed be suppressed in this T2SL.
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