Dr. Charles Joenathan
Professor/Chair at Rose-Hulman Institute of Technology
SPIE Involvement:
Author
Publications (33)

Proceedings Article | 28 June 2023 Open Access Paper
Proceedings Volume 12723, 127231Q (2023) https://doi.org/10.1117/12.2670793
KEYWORDS: Optical engineering, Engineering, Design and modelling, Optics education, Lens design, Industry

Proceedings Article | 14 September 2018 Open Access Presentation + Paper
Proceedings Volume 10741, 1074102 (2018) https://doi.org/10.1117/12.2319939
KEYWORDS: Light sources and illumination, Light emitting diodes, Video, LED lighting, Optical engineering, Prototyping, Nonimaging optics, Solar cells, Light, Reflectors

Proceedings Article | 15 June 2018 Paper
Proceedings Volume 10692, 106921F (2018) https://doi.org/10.1117/12.2311303
KEYWORDS: Interferometers, Phase shifting, Visibility, Interferometry, Polarization, Mirrors, Wave plates, Phase shifts, CCD cameras, Beam splitters

Proceedings Article | 28 August 2016 Paper
Proceedings Volume 9960, 99600H (2016) https://doi.org/10.1117/12.2240623
KEYWORDS: Wavefront sensors, Interferometers, Interferometry, Quality measurement, Metrology, Michelson interferometers, Monochromatic aberrations, Wavefronts, Mirrors, Beam splitters

SPIE Journal Paper | 15 February 2016
Charles Joenathan, Ashley Bernal, Youn Woonghee, Robert Bunch, Christopher Hakoda
OE, Vol. 55, Issue 02, 024101, (February 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.2.024101
KEYWORDS: Mirrors, Interferometers, Michelson interferometers, Beam splitters, Ferroelectric materials, Reflection, Modulation, Sensors, Optical engineering, Interferometry

Showing 5 of 33 publications
Conference Committee Involvement (6)
Two- and Three-Dimensional Methods for Inspection and Metrology V
12 September 2007 | Boston, MA, United States
Two- and Three-Dimensional Methods for Inspection and Metrology IV
1 October 2006 | Boston, Massachusetts, United States
Optics East 2006
1 October 2006 | Boston, United States
Interferometry XIII: Techniques and Analysis
14 August 2006 | San Diego, California, United States
Two- and Three-Dimensional Methods for Inspection and Metrology III
25 October 2005 | Boston, MA, United States
Showing 5 of 6 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top