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Chris Dames
Assistant Professor at Univ of California Riverside
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Publications (1)
Proceedings Article | 19 October 2006 Paper
A modified high-resolution TEM for thermoelectric properties measurements of nanowires and nanotubes
C. Dames, S. Chen, C. Harris, J. Huang, Z. Ren, M. Dresselhaus, G. Chen
Proceedings Volume 6370, 63700E (2006) https://doi.org/10.1117/12.689422
KEYWORDS: Resistance, Transmission electron microscopy, Scanning tunneling microscopy, Thermoelectric materials, Tungsten, Carbon, Temperature metrology, Carbon nanotubes, Zinc oxide, Nanowires
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