Dr. Frederic Roger Profile

Dr. Frederic Roger

at ams-OSRAM AG

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Publications (1)

Proceedings Article | 16 September 2014 Paper

Investigations on CMOS photodiodes using scanning electron microscopy with electron beam induced current measurements

A. Kraxner, F. Roger, B. Loeffler, M. Faccinelli, S. Kirnstoetter, R. Minixhofer, P. Hadley

Proceedings Volume 9236, 923607 (2014) https://doi.org/10.1117/12.2066124

KEYWORDS: Electron beams, Doping, Diodes, Diffusion, Photodiodes, Scanning electron microscopy, TCAD, Optical simulations, Computer simulations, Optical testing

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