Dr. Jack Downey Profile

Dr. Jack Downey

at GlobalFoundries

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Author

Publications (2)

Proceedings Article | 26 May 2022 Poster + Paper

Conducting a metrology measurement using M-FOUP system in fab environment

Yevgeny Lifshitz, Jeffrey Wood, David Novack, Jack Downey, Dinay Dash, Shiladitya Chakravorty, Michael Raga-Barone, Taher Kagalwala, Alfred Hajtman, John Byrnes, Csaba Nándor Bitvai, Anna Bölcskei-Molnár, Peter Basa

Proceedings Volume 12053, 1205328 (2022) https://doi.org/10.1117/12.2614337

KEYWORDS: Metrology, Semiconducting wafers, Wafer testing, Control systems, Time metrology, Reflectometry, Reflectance spectroscopy, Manufacturing, System integration, Environmental sensing

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Proceedings Article | 25 October 2016 Paper

Reticle inspection equipment productivity increase using SEMI specification for reticle and pod management

Ron Taylor, Jack Downey, Jeffrey Wood, Yen-Hung Lin, Bharathi Bugata, Dongsheng Fan, Carl Hess, Mark Wylie

Proceedings Volume 9985, 99850L (2016) https://doi.org/10.1117/12.2241129

KEYWORDS: Reticles, Inspection, Inspection equipment, Factory automation, Manufacturing, High volume manufacturing, Control systems, Image processing, Semiconducting wafers, Roads

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