The AXAF CCD imaging spectrometer (ACIS) consists of ten CCDs arranged in two arrays, one for imaging astronomical fields and one to be used in conjunction with transmission gratings for spectroscopy of astrophysical sources. ACIS uses Lexan/aluminum meshless films placed above these two CCD arrays to filter by mapping their soft x-ray transmission on fine spatial scales, so that the filter response can be removed from the CCD data and a more accurate estimate of the true sky recovered. We measured engineering and flight versions of these filters at the University of Wisconsin Synchrotron Radiation Center between June 1995 and April 1996. For all data, better than one percent accuracy in transmission as a function of energy was maintained over the entire filter area. The resulting transmission maps reveal spatial non-uniformities in the filters of about 0.5 percent to 2 percent. These transmission maps provide the finest spatial calibration ever achieved on such filters.
Interfacial roughness correlation in W/C multilayer films with periods of 23 angstroms, 30 angstroms, and 37 angstroms is examined with x-ray diffraction using (lambda) in the 10 angstroms to 13 angstroms range and (lambda) equals 1.54 angstroms. Transverse scans through multilayer Bragg reflections are analyzed to determine the magnitude and lateral correlation length of the component of interfacial roughness that is perfectly correlated through the multilayer stack. The results are independent of wavelength, even though hard x rays sample match more deeply into the film, indicating that interfacial roughness is not changing through these films.
A double mirror multilayer monochromator was constructed for the purpose of irradiating live cell cultures at the Synchrotron Radiation Center, University of Wisconsin-Madison. The monochromator is designed for the soft x-ray region with photon energies between 273 eV and 2400 eV. Multilayer mirrors with 55 bilayers of W/C and a bilayer spacing of d equals 3.0 nm are sputter deposited on Si substrates. By proper masking of the sputtering sources, variation in the bilayer spacing over the area of the mirror is minimized. The use of suitable filters with a Si(Li) detector allows determination of the spectral output of the monochromator. The output power of the monochromator between 273 eV and 900 eV is measured. Application of the monochromator to radiation biology and materials science are discussed.
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