Prof. James H. Pikul
at Univ of Pennsylvania
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 October 2022 Presentation + Paper
Proceedings Volume 12242, 1224208 (2022) https://doi.org/10.1117/12.2632619
KEYWORDS: X-rays, Tomography, Spatial resolution, Nickel, X-ray microscopy, Microscopes, Lenses, X-ray optics, 3D image processing, X-ray imaging

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