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Dr. Jaspal P. Bange
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Publications (1)
Proceedings Article | 19 January 2011 Paper
Comparison of TiO2-doped SiO2 films from two organosilicon precursors
Jaspal Bange, Lalit Patil, D. Gautam
Proceedings Volume 7986, 79860S (2011) https://doi.org/10.1117/12.888153
KEYWORDS: Silica, Scanning electron microscopy, Titanium, Silicon, Particles, Refractive index, Silicon films, Crystals, Ellipsometry, Titanium dioxide
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