Jean-François Rioux
at CMC Electronics Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 March 2022 Presentation + Paper
Patrick Lepage, Jean-François Rioux, Paul Verville, Edith Talbot, Nicolas Bélanger, Bernicy Fong
Proceedings Volume 12008, 120080L (2022) https://doi.org/10.1117/12.2603212
KEYWORDS: Receivers, Avalanche photodetectors, Fast overload recovery, Temperature metrology, Signal detection, Laser range finders, Indium gallium arsenide, Backscatter, LIDAR, Resistors

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