Dr. Jean-Luc M. Tissot
Technical Director & Marketing Director at LYNRED
SPIE Involvement:
Author | Editor | Instructor
Publications (59)

Proceedings Article | 21 November 2017 Open Access Paper
Proceedings Volume 10569, 1056902 (2017) https://doi.org/10.1117/12.2307954
KEYWORDS: Amorphous silicon, Sensors, Microbolometers, Bolometers, Resistance, Reliability, Signal to noise ratio, Infrared radiation, Silicon, Staring arrays

Proceedings Article | 8 November 2012 Paper
P. Robert, J. Tissot, D. Pochic, V. Gravot, F. Bonnaire, H. Clerambault, A. Durand, S. Tinnes
Proceedings Volume 8541, 85410B (2012) https://doi.org/10.1117/12.974823
KEYWORDS: Sensors, Readout integrated circuits, Amorphous silicon, Bolometers, Microbolometers, Infrared imaging, Packaging, Analog electronics, Infrared sensors, Long wavelength infrared

Proceedings Article | 31 May 2012 Paper
P. Robert, JL. Tissot, D. Pochic, V. Gravot, F. Bonnaire, H. Clerambault, A. Durand, S. Tinnes
Proceedings Volume 8353, 83531F (2012) https://doi.org/10.1117/12.920996
KEYWORDS: Sensors, Readout integrated circuits, Amorphous silicon, Bolometers, Microbolometers, Staring arrays, Packaging, Infrared imaging, Analog electronics, Infrared sensors

Proceedings Article | 31 May 2012 Paper
Proceedings Volume 8353, 83531M (2012) https://doi.org/10.1117/12.918534
KEYWORDS: Signal to noise ratio, Staring arrays, Microbolometers, Wigner distribution functions, Amorphous silicon, Image processing, Infrared imaging, Long wavelength infrared, Imaging systems, Interference (communication)

Proceedings Article | 22 September 2011 Paper
Patrick Robert, Alain Durand, Vincent Gravot, David Pochic, Jean-Luc Tissot
Proceedings Volume 8167, 816729 (2011) https://doi.org/10.1117/12.897001
KEYWORDS: Signal to noise ratio, Sensors, Analog electronics, Infrared radiation, Bolometers, Infrared sensors, Readout integrated circuits, Infrared imaging, Video, Nonuniformity corrections

Showing 5 of 59 publications
Proceedings Volume Editor (3)

SPIE Conference Volume | 25 January 2013

SPIE Conference Volume | 13 October 2011

SPIE Conference Volume | 16 September 2008

Conference Committee Involvement (9)
Infrared Technology and Applications XXXIX
29 April 2013 | Baltimore, Maryland, United States
Detectors and Associated Signal Processing V
27 November 2012 | Barcelona, Spain
Infrared Technology and Applications XXXVIII
23 April 2012 | Baltimore, Maryland, United States
Detectors and Associated Signal Processing IV
5 September 2011 | Marseille, France
Infrared Technology and Applications XXXVII
25 April 2011 | Orlando, Florida, United States
Showing 5 of 9 Conference Committees
Course Instructor
SC732: Infrared FPAs: Cooled and Uncooled Detectors
This course addresses the IR detector field focusing on IRFPAs (IR detector of second generation and third generation). It will provide a broad and useful background on these IR detectors and consists of two parts: one focusing on uncooled detectors (presented by Jean Luc Tissot) and a second dealing with cooled detectors (presented by Philippe Tribolet). For the different types of detectors, the technologies (including newer ones) are briefly described and the state of the art is presented. Main applications and the differences between and advantages of the various types available are also discussed. Finally, guidelines for estimating and choosing IRFPAs are discussed.
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