Jin-Sook Choi
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 20 October 2006 Paper
Jin-Sook Choi, Jae-Pil Shin, Jong-Bae Lee, Moon-Hyun Yoo, Jeong-Taek Kong
Proceedings Volume 6349, 634918 (2006) https://doi.org/10.1117/12.686491
KEYWORDS: Photomasks, Visualization, Data modeling, Optical proximity correction, Model-based design, Data centers, Resolution enhancement technologies, Standards development, Software development, Computing systems

Proceedings Article | 20 May 2006 Paper
Jae-pil Shin, Jin-sook Choi, Sung-gyu Park, Jong-bae Lee, Moon-hyun Yoo, Jeong-taek Kong
Proceedings Volume 6283, 628339 (2006) https://doi.org/10.1117/12.681828
KEYWORDS: Control systems, Etching, Critical dimension metrology, Logic, Photomasks, Process engineering, Logic devices, Cadmium, Electronics, Bridges

Proceedings Article | 28 June 2005 Paper
Jae-pil Shin, Jin-sook Choi, Dae-hyun Jung, Jee-hyong Lee, Moon-hyun Yoo, Jeong-taek Kong
Proceedings Volume 5853, (2005) https://doi.org/10.1117/12.617368
KEYWORDS: Neural networks, Lithography, Resolution enhancement technologies, Artificial neural networks, Optical proximity correction, SRAF, Error analysis, Critical dimension metrology, Cadmium, Photomasks

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