Dr. Jong U. Kim Profile

Dr. Jong U. Kim

at Texas A&M Univ

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Author

Publications (6)

Proceedings Article | 23 May 2005 Paper

Physics behind the new technique "Sensing of phage-triggered ion cascades" (SEPTIC) for the prompt identification of bacteria

L. Kish, Sergey Bezrukov, A. Der, M. Cheng, M. King, R. Young, S. Seo, J. Kim

Proceedings Volume 5846, (2005) https://doi.org/10.1117/12.610671

KEYWORDS: Bacteria, Ions, Physics, Injuries, Mirrors, Clouds, Sensors, Diffusion, Linear filtering, Biology

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Proceedings Article | 23 May 2005 Paper

Nanoscale detection of bacteriophage triggered ion cascade

Maria Dobozi-King, Sungkyu Seo, Jong Kim, Mosong Cheng, Laszlo Kish, Ryland Young

Proceedings Volume 5841, (2005) https://doi.org/10.1117/12.611050

KEYWORDS: Bacteria, Ions, Bridges, Stochastic processes, Diagnostics, Molecular bridges, Pathogens, Adsorption, Amplifiers, Field effect transistors

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Proceedings Article | 23 May 2005 Paper

Identifying different types of stochastic processes with the same spectra

Jong Kim, Laszlo Kish, Gabor Schmera

Proceedings Volume 5846, (2005) https://doi.org/10.1117/12.609503

KEYWORDS: Stochastic processes, Pattern recognition, Homeland security, Biometrics, Forensic science, Statistical analysis, Sensors, Biological and chemical sensing, Electrical engineering, Warfare

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Proceedings Article | 23 May 2005 Paper

Nano device for monitoring electrical fluctuations on bacterial scale

Sungkyu Seo, Jong Kim, Maria Dobozi-King, Ryland Young, Sergey Bezrukov, Laszlo Kish, Mosong Cheng

Proceedings Volume 5844, (2005) https://doi.org/10.1117/12.611244

KEYWORDS: Bacteria, Ions, Sensors, Field effect transistors, Signal detection, Polymethylmethacrylate, Solid state electronics, Electron beam lithography, Molecules, Microfluidics

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Proceedings Article | 25 May 2004 Paper

Error rate in current-controlled logic processors with shot noise

Jong Kim, Laszlo Kish

Proceedings Volume 5472, (2004) https://doi.org/10.1117/12.564330

KEYWORDS: Clocks, Logic, Transistors, Solids, Interference (communication), Error analysis, Chemical elements, Signal processing, Nanoelectronics, Stochastic processes

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Showing 5 of 6 publications

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