Dr. Keith A. Snail Profile

Dr. Keith A. Snail

at Naval Research Lab

SPIE Involvement:

Author

Proceedings Article | 29 September 2004 Paper

Radiance aa a paradigm for a wave description of optical measurements

Roland Winston, Yupin Sun, Robert Littlejohn, Keith Snail

Proceedings Volume 5529, (2004) https://doi.org/10.1117/12.562523

KEYWORDS: Sensors, Signal detection, Radiometry, Cameras, Optical testing, Diffraction, Correlation function, Spherical lenses, Black bodies, Wave propagation

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Proceedings Article | 19 November 2001 Paper

Experimental tests of radiative transfer incorporating statistical optics using blackbody sources

YuPin Sun, Roland Winston, Joseph O'Gallagher, Keith Snail

Proceedings Volume 4446, (2001) https://doi.org/10.1117/12.448817

KEYWORDS: Black bodies, Aerospace engineering, Radiative transfer, Geometrical optics, Statistical optics, Cameras, Sensors, Instrument modeling, Diffraction, Space operations

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SPIE Journal Paper | 1 February 2000

Spectral and radiometric calibration of midwave and longwave infrared cameras

Marc Mermelstein, Keith Snail, Richard Priest

OE, Vol. 39, Issue 02, (February 2000) https://doi.org/10.1117/12.10.1117/1.602370

KEYWORDS: Cameras, Calibration, Infrared cameras, Black bodies, Spectral calibration, Optical filters, Sensors, Infrared imaging, Medium wave, Temperature metrology

Proceedings Article | 6 October 1999 Paper

Measuring radiance: a comparison of theory with experiment

YuPin Sun, Roland Winston, Keith Snail

Proceedings Volume 3781, (1999) https://doi.org/10.1117/12.368257

KEYWORDS: Geometrical optics, Correlation function, Radiometry, Black bodies, Statistical optics, Physics, Analytical research, Astatine, Absorption, Nonimaging optics

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Proceedings Article | 11 November 1996 Paper

Optical charaterization of black appliques

Keith Snail, Dennis Brown, Joseph Costantino, Wendy Shemano, Carl Schmidt, William Lynn, Christopher Seaman, Timothy Knowles

Proceedings Volume 2864, (1996) https://doi.org/10.1117/12.258336

KEYWORDS: Bidirectional reflectance transmission function, Coating, Scattering, Infrared radiation, Reflectivity, Adhesives, Optical fibers, Grazing incidence, Stray light, Carbon

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For some stray light applications, it may be advantageous to use a black applique rather than a conventional black coating. Appliques consist of a free-standing sheet of black material and an adhesive or other means for attaching the applique to a substrate. In this paper the optical scatter in the visible and infrared of black appliques from Battelle, Dupont, Edmund Scientific, Energy Science Laboratory, Inc. (ESLI), Rippey and Rodel is reported and compared to Martin Black. The Rippey and Rodel appliques are sold as polishing cloths for the semiconductor industry, whereas the ESLI applique was originally developed as a low sputter yield coating. The Battelle applique consists of a carbon loaded polyurethane film with a surface which is heat molded into a micro-grooved pattern. The ESLI applique consists of high aspect ratio fibers mounted in an adhesive base and was the blackest applique of all those investigated. For an incidence angle of 10 degrees, a scattering angle of 45 degrees and a wavelength of 632.8 nm, the BRDF of the best ESLI applique was 3 multiplied by 10^-4, compared to 1 multiplied by 10^-3 for the best Battelle applique, 1.5 multiplied by 10^-3 for a representative Martin Black sample and 1.8 multiplied by 10^-3 for the Edmund applique. The Battelle applique is quasi-diffuse due to its surface microstructure, with a higher BRDF (2-5 multiplied by 10^-3) at scatter angles less than 15 degrees For a wavelength of 10.6 micrometer, an incidence angle of 7.5 degrees and a scatter angle of 45 degrees, the BRDF of the ESLI coating (1 multiplied by 10^-3) was slightly higher than Martin Black (8 multiplied by 10 ^-4), with the Battelle applique exhibiting strong dependences on scatter angle and groove orientation. In the 2 - 14 micrometer spectral range, the directional hemispherical reflectance of the ESLI coating at a 20 degree incidence angle is below 0.45% and only weakly dependent on incidence angle to 60 degrees. In- plane and cross-plane BRDF measurements at 3.39 micrometer are reported on a 'biased' ESLI coating which is designed for use at near grazing incidence. In-plane BRDF measurements at wavelengths of 0.6328 and 10.6 micrometer are reported for most of the appliques studied.

Proceedings Article | 14 December 1992 Paper

Scattering and absorption of CVD diamond windows

Carolyn Hickey, J. DeRosa, Keith Snail

Proceedings Volume 1760, (1992) https://doi.org/10.1117/12.130795

KEYWORDS: Scattering, Diamond, Light scattering, Chemical vapor deposition, Absorption, Infrared radiation, Scatter measurement, Reflectivity, Transmittance, Polishing

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Proceedings Article | 1 December 1991 Paper

Polishing of filament-assisted CVD diamond films

Carolyn Hickey, Thomas Thorpe, Arthur Morrish, James Butler, C. Vold, Keith Snail

Proceedings Volume 1534, (1991) https://doi.org/10.1117/12.48281

KEYWORDS: Polishing, Diamond, Surface finishing, Iron, Etching, Hydrogen, Carbon, Crystals, Chemical vapor deposition, Silicon

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Proceedings Article | 24 October 1991 Paper

Nonimaging optics and the measurement of diffuse reflectance

Leonard Hanssen, Keith Snail

Proceedings Volume 1528, (1991) https://doi.org/10.1117/12.49141

KEYWORDS: Sensors, Integrating spheres, Optical spheres, Nonimaging optics, Compound parabolic concentrators, Diffuse reflectance spectroscopy, Signal detection, Error analysis, Reflectivity, Light scattering

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Proceedings Article | 1 January 1991 Paper

CVD diamond as an optical material for adverse environments

Keith Snail

Proceedings Volume 1330, (1991) https://doi.org/10.1117/12.47519

KEYWORDS: Diamond, Chemical vapor deposition, Polishing, Crystals, Absorption, Carbon, Surface finishing, Transmittance, Iron, Nitrogen

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Proceedings Article | 1 December 1990 Paper

Growth, polishing, and optical scatter of diamond thin films

Thomas Thorpe, Arthur Morrish, Leonard Hanssen, James Butler, Keith Snail

Proceedings Volume 1325, (1990) https://doi.org/10.1117/12.22462

KEYWORDS: Diamond, Polishing, Surface finishing, Hydrogen, Carbon, Chemical vapor deposition, Transmittance, Thin films, Visible radiation, Infrared radiation

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Showing 5 of 10 publications

Conference Committee Involvement (2)

Optical Diagnostics

3 August 2005 | San Diego, California, United States

Optical Diagnostic Methods for Inorganic Materials III

6 August 2003 | San Diego, California, United States

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