X-ray ptychography in 3D is ideal for quantitative structural analysis with highest spatial resolution. The Ptychographic Nano-Analytical Microscope (PtyNAMi) installed at beamline P06 at PETRA III (DESY, Hamburg) is optimized for high-resolution scanning hard X-ray microscopy. The current data evaluation pipeline for ptychographic tomography at PtyNAMi is outlined and the performance of the microscope demonstrated at the example of an inverse opal Ni sample.
While modern x-ray microscopes at synchrotron radiation sources and free-electron lasers require x-ray optics of highest quality, these optics often show aberrations due to limitations in fabrication technology. Based on ptychography, we determine these aberrations and fabricate tailor made refractive phase plates to compensate for them. Starting from the aberrated optics, diffraction-limited beams can be generated by introducing the phase plate behind these optics. In addition, the wavefront can be modified to generate custom beams for special needs, such as donut-shaped beams with orbital angular momentum or for structured-illumination microscopy. The nanofocused beam can be engineered in shape and phase by introducing specially designed phase plates. We introduce a general scheme for wavefront engineering and illustrate it with a numerical example.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.