Minseung Song
at SAMSUNG Electronics Co., Ltd.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2024 Paper
Proceedings Volume 12953, 1295309 (2024) https://doi.org/10.1117/12.3010718
KEYWORDS: Mirrors, Metrology, Simulations, Light sources and illumination, Extreme ultraviolet, Source mask optimization, Nanoimprint lithography, Critical dimension metrology, Semiconducting wafers, Phase shifts

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