Raúl R. Rodríguez del Rosario
at Instituto Univ. de Microelectrónica Aplicada
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 May 2013 Paper
Proceedings Volume 8764, 876404 (2013) https://doi.org/10.1117/12.2017149
KEYWORDS: Cadmium sulfide, Field effect transistors, Advanced distributed simulations, Transistors, Circuit switching, Cesium, Resistance, Performance modeling, Numerical simulations, Tin

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