Dr. Richard Koops
at VSL Dutch Metrology Institute
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 18 June 2024 Paper
Felix Rosenthal, Tobias Pahl, Tim Eckhardt, Sebastian Hagemeier, Jonas Compagnone, Tim Czasch, Michael Diehl, Richard Koops, Peter Lehmann
Proceedings Volume 12997, 129970N (2024) https://doi.org/10.1117/12.3017579
KEYWORDS: 3D modeling, 3D metrology, Confocal microscopy, Microscopes, 3D image processing, Fourier optics, Modeling

Proceedings Article | 15 March 2023 Presentation
Martine Kuiper, Richard Koops, Rienk Nieuwland, Ton van Leeuwen, Edwin van der Pol
Proceedings Volume PC12383, PC1238307 (2023) https://doi.org/10.1117/12.2650545
KEYWORDS: Nanoparticles, Metrology, Refractive index, Particles, Flow cytometry, Scatter measurement, Optical testing, Light scattering, Precision measurement, Mie scattering

Proceedings Article | 6 March 2023 Presentation
Martine Kuiper, Richard Koops, Rienk Nieuwland, Ton van Leeuwen, Edwin van der Pol
Proceedings Volume PC12370, PC1237002 (2023) https://doi.org/10.1117/12.2650587
KEYWORDS: Refractive index, Environmental sensing, Solids, Liquids, Flow cytometry, Temperature metrology, Silica, Prisms, Particles, Nanoparticles

Proceedings Article | 20 November 2003 Paper
Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503069
KEYWORDS: 3D metrology, Scanning probe microscopy, Data acquisition, Inspection, Scanning probe microscopes, Calibration, Image analysis, Scanning tunneling microscopy, Image processing, Nanotechnology

Proceedings Article | 20 November 2003 Paper
Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503082
KEYWORDS: Interferometers, Atomic force microscopy, Scanning probe microscopes, Control systems, Scanners, Clocks, Head, Feedback control, Feedback loops, Mirrors

Showing 5 of 7 publications
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