Dr. Robert W. Crocker Profile

Dr. Robert W. Crocker

at Sandia National Labs California

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 15 April 2008 Paper

Analysis of flow-cytometer scattering and fluorescence data to identify particle mixtures

Thomas Reichardt, Scott Bisson, Robert Crocker, Thomas Kulp

Proceedings Volume 6945, 69450R (2008) https://doi.org/10.1117/12.777407

KEYWORDS: Particles, Scattering, Luminescence, Data acquisition, Sensors, Signal detection, Atmospheric particles, Homeland security, Proteins, Laser induced fluorescence

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Proceedings Article | 15 April 2008 Paper

Confirmatory measurement channels for LIF-based bioaerosol instrumentation

Scott Bisson, Robert Crocker, Thomas Kulp, Thomas Reichardt, Peter Reilly, William Whitten

Proceedings Volume 6945, 69450S (2008) https://doi.org/10.1117/12.777698

KEYWORDS: Aerosols, Particles, Laser induced fluorescence, Proteins, Sensors, Scattering, Statistical analysis, Atmospheric particles, Signal detection, Luminescence

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Proceedings Article | 23 January 2006 Paper

Injection molded microfluidic devices for biological sample separation and detection

Alfredo Morales, Blake Simmons, Thomas Wallow, K. Jeffery Campbell, Seethambal Mani, Brita Mittal, Robert Crocker, Eric Cummings, Rafael Davalos, Linda Domeier, Marion Hunter, Karen Krafcik, Gregory McGraw, Bruce Mosier, Shane Sickafoose

Proceedings Volume 6109, 610901 (2006) https://doi.org/10.1117/12.648135

KEYWORDS: Microfluidics, Particles, Glasses, Polymers, Nickel, Semiconducting wafers, Etching, Dielectrophoresis, Electrodes, Capillaries

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Proceedings Article | 22 January 2005 Paper

Fabrication and characterization of polymer microfluidic devices for bio-agent detection

Alfredo Morales, John Brazzle, Robert Crocker, Linda Domeier, Eric Goods, John Hachman, Cindy Harnett, Marion Hunter, Seethambal Mani, Bruce Mosier, Blake Simmons

Proceedings Volume 5716, (2005) https://doi.org/10.1117/12.592802

KEYWORDS: Microfluidics, Polymers, Glasses, Nickel, Interferometry, Glass molding, Metrology, Semiconducting wafers, Reliability, Diffusion

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