Dr. Roland Thielsch
at Southwall Europe GmbH
SPIE Involvement:
Author
Publications (30)

Proceedings Article | 5 October 2005 Paper
Proceedings Volume 5963, 59630N (2005) https://doi.org/10.1117/12.625100
KEYWORDS: Vacuum ultraviolet, Calcium, Silicon films, Atomic force microscopy, Refractive index, Lanthanides, Thin films, Lanthanum, Silicon, Gadolinium

Proceedings Article | 5 October 2005 Paper
Proceedings Volume 5963, 59630O (2005) https://doi.org/10.1117/12.625096
KEYWORDS: Refractive index, Crystals, Thin films, Silica, Vacuum ultraviolet, Excimer lasers, Optical properties, Deep ultraviolet, Diffraction, Reflectivity

Proceedings Article | 25 February 2004 Paper
Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.512958
KEYWORDS: Refractive index, Ions, Crystals, Water, Data modeling, X-ray diffraction, Thin films, Diffraction, Interfaces, Ion beams

Proceedings Article | 25 February 2004 Paper
Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.512952
KEYWORDS: Coating, Crystals, Silicon, Temperature metrology, Thin films, Silica, Ultraviolet radiation, Multilayers, Diffraction, Silicon films

Proceedings Article | 30 May 2003 Paper
Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.472391
KEYWORDS: Luminescence, Thin films, Coating, Aluminum, Ultraviolet radiation, Multilayers, Mirrors, Laser induced fluorescence, Color centers, Silica

Showing 5 of 30 publications
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