Dr. Saul Doherty
at Thales Optronics Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 May 2005 Paper
Abraham Ogwu, Thomas Hellwig, Saul Doherty, David Haddow, Klaus-Peter Moellman, Francis Placido
Proceedings Volume 5786, (2005) https://doi.org/10.1117/12.603337
KEYWORDS: Corrosion, Resistance, Boron, Polarization, Plasma enhanced chemical vapor deposition, Coating, Electrodes, Chemical analysis, Dielectric spectroscopy, Polishing

Proceedings Article | 18 May 2005 Paper
Abraham Ogwu, Thomas Hellwig, Saul Doherty, David Haddow, Klaus-Peter Mollman, Frank Placido
Proceedings Volume 5786, (2005) https://doi.org/10.1117/12.603327
KEYWORDS: Boron, Plasma enhanced chemical vapor deposition, Atomic force microscopy, Scanning electron microscopy, X-rays, Photoemission spectroscopy, Surface roughness, Optoelectronics, X-ray microscopy, Manufacturing

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