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Dr. Suzanne P. Jarvis
at Trinity College Dublin
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 3 February 2012 Paper
Restoration of high-resolution AFM images captured with broken probes
Y. F. Wang, D. Corrigan, C. Forman, S. Jarvis, A. Kokaram
Proceedings Volume 8227, 82271A (2012) https://doi.org/10.1117/12.906752
KEYWORDS: Atomic force microscopy, Distortion, Hough transforms, Deconvolution, Image analysis, Image processing, Convolution, Image resolution, Gaussian filters, Atomic force microscope
Proceedings Volume Editor (1)
SPIE Conference Volume | 16 May 2007
Nanotechnology III
Conference Committee Involvement (1)
Nanotechnology
2 May 2007 | Maspalomas, Gran Canaria, Spain
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