This study established identification manners with self-organizing feature map (SOM) to achieve the goal of monitoring Engineering Change (EC) based on historical data of a company that specializes in computers and peripherals. The product life cycle of this company is 3–6 months. The historical data were divided into three parts, each covering four months. The first part, comprising 2,343 records from January to April (the training period), comprise the Control Group. The second and third parts comprise Experimental Groups (EG) 1 and 2, respectively. For EG 1 and 2, the successful rate of recognizing information on abnormal ECs was approximately 96% and 95%, respectively. This paper shows the importance and screening procedures of abnormal engineering change for a particular company specializing in computers and peripherals.
To develop diverse anisotropic thin films, asymmetric bideposition technique is introduced to
fabricate tilt columnar Ta2O5 films with biaxial optical property. The asymmetric bideposition is
achieved using two different opposite deposition angles (a+,a-) and two different thicknesses of
opposite deposited subdeposits. The two sets of Ta2O5 columnar thin films associated with deposited
subdeposits (d+,d-)=(5.2,2.8) are prepared at the opposite deposition angles (a+,a-)=(70,-40), (75,-40),
(80,-40) and at the opposite deposition angles (a+,a-)=(70,-50), (75,-50), (80,-50). Columnar thin films
with various column angle and biaxial properties are measured their planar birefringence and three
principal indexes. The larger column angle leads to higher principal indices. It is demonstrated that the
asymmetric bideposition can enhance the birefringence of a tilted columnar thin film.ntut.edu.tw
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.