Vincent Libertiaux
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 April 2022 Presentation + Paper
T. Madmad, V. Libertiaux, C. De Vleeschouwer
Proceedings Volume 12047, 120470X (2022) https://doi.org/10.1117/12.2612661
KEYWORDS: X-rays, Image filtering, X-ray imaging, Visibility, Image processing, Nondestructive evaluation, Visualization, Image enhancement, Inspection, Image quality

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