Prof. Xin Wang Profile

Prof. Xin Wang

at Tongji Univ

SPIE Involvement:

Author

Publications (17)

SPIE Journal Paper | 31 May 2023

Study on full-aperture intensity response measurement for x-ray Kirkpatrick–Baez microscope

Mingtao Li, Xin Wang, Jie Xu, Wenjie Li, Xinye Xu, Liang Chen, Baozhong Mu

OE, Vol. 62, Issue 05, 055103, (May 2023) https://doi.org/10.1117/12.10.1117/1.OE.62.5.055103

KEYWORDS: Spectral response, X-rays, Microscopes, Grazing incidence, Mirrors, Calibration, X-ray imaging, Optical engineering, Imaging systems, Reflection

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Proceedings Article | 20 September 2020 Presentation + Paper

Design of x-ray backscatter imaging system for vehicle detection

Baolu Yang, Xin Wang, Haiping Shen, Jie Xu, Kai Xiong, Baozhong Mu

Proceedings Volume 11542, 115420L (2020) https://doi.org/10.1117/12.2571044

KEYWORDS: X-rays, Backscatter, X-ray imaging, Imaging systems, Explosives, Inspection, Image processing, Signal processing, Digital image processing, Weapons

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Proceedings Article | 21 August 2020 Presentation + Paper

Development of high resolution Kirkpatrick-Baez x-ray microscope based on aspherical mirrors for ICF diagnostics

Xinye Xu, Baozhong Mu, Jie Xu, Xin Wang, Liang Chen, Zhanshan Wang

Proceedings Volume 11491, 114910C (2020) https://doi.org/10.1117/12.2567923

KEYWORDS: Microscopes, Spatial resolution, Mirrors, X-ray imaging, Diagnostics, Reflectivity, Imaging systems

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Proceedings Article | 8 October 2018 Paper

Simulation on x-rays backscatter imaging based on Monte Carlo methods for security inspection

Shengling Huang, Xin Wang, Yifan Chen, Jie Xu, Baozhong Mu

Proceedings Volume 10802, 1080203 (2018) https://doi.org/10.1117/12.2324630

KEYWORDS: X-rays, Backscatter, Compton scattering, X-ray imaging, Photons, Monte Carlo methods, Inspection, Explosives

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Materials can produce scattering effects on incident photons and ultrasound waves, by collecting scattered signal, the objects can be imaged. Backscattering imaging is a unique technique whereby the photons or ultrasound from an object in the generally backward direction are detected. Backscatter technology has been widely used in astronomy^{1, 2}, medicine^{3, 4}, security inspection^5-9and other fields. Especially in the field of security, X-ray transmission is also the main means of inspecting dangerous goods, such as gun, knife, explosive, drug and so on. This technique is effective for detecting metal objects but difficult for organics such as drug and plastic explosive, because the attenuation coefficient of most organic matter to X-ray radiation is very low, the material appears to be transparent. The main elements of drug and plastic explosive are carbon, hydrogen, oxygen and nitrogen, which can produce strong scattering for incident X-ray. And, by collecting backscattered X-ray, bright images of organics such as drug and plastic explosive can be obtained. Relative to X-ray transmission, the backscattering imaging has three advantages: First, the backscatter images highlight organic materials, which appear significantly brighter than most metallic or inorganic materials. As a result, organic threats or contraband materials such as explosives and drugs can be more easily detected in the backscatter images than in the corresponding transmission images. Second, by changing the energy of X-ray, backscattering imaging can be utilized for detecting dangerous matters hidden inside or on the surface of objects, such as container and human body. Third, X-ray detectors can be placed on the same side of the objects being inspected as the X-ray source, which allow inspection of moving car or container vehicles by mounting the detectors and X-ray source on a mobile platform that drives past the objects of interest¹⁰. In addition, the equipment based on this technology can be miniaturized, which enable to extend the devise into a narrow space (car, container, etc.) and scan internally. So, X-ray backscattering imaging has become a significant method for detecting dangerous organics in the field of security inspection. At present, several inspection technologies based on X-ray backscattering imaging have been developed, for example, “Flying Spot” scanner

, coded aperture imaging9 and lobster-eye imaging^6-8, etc.

Proceedings Article | 8 October 2018 Paper

Development of energy dispersive x-ray diffraction system for identifying dangerous materials

Yifan Chen, Xin Wang, Baozhong Mu, Qinghua Song

Proceedings Volume 10802, 1080202 (2018) https://doi.org/10.1117/12.2324616

KEYWORDS: Diffraction, Inspection, X-ray diffraction, Photons, Explosives, X-rays

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Proceedings Article | 24 October 2016 Paper

The image enhancement and region of interest extraction of lobster-eye X-ray dangerous material inspection system

Qi Zhan, Xin Wang, Baozhong Mu, Jie Xu, Qing Xie, Yaran Li, Yifan Chen, Yanan He

Proceedings Volume 9995, 99950Y (2016) https://doi.org/10.1117/12.2242016

KEYWORDS: Image processing, X-rays, X-ray imaging, Inspection, Imaging systems, Image quality, Backscatter, Polymethylmethacrylate, X-ray detectors, Sensors

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Proceedings Article | 24 October 2016 Presentation + Paper

A novel biometric X-ray backscatter inspection of dangerous materials based on a lobster-eye objective

Jie Xu, Xin Wang, Baozhong Mu, Qi Zhan, Qing Xie, Yaran Li, Yifan Chen, Yanan He

Proceedings Volume 9995, 999507 (2016) https://doi.org/10.1117/12.2241970

KEYWORDS: X-rays, Inspection, Backscatter, Explosives, X-ray imaging, Reflectors, Metals, Imaging systems, Signal detection, Glasses

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Proceedings Article | 15 September 2016 Presentation + Paper

Development of a high-energy Kirkpatrick Baez microscope

Yaran Li, Baozhong Mu, Qing Xie, Xin Wang, Zhanshan Wang

Proceedings Volume 9963, 99630J (2016) https://doi.org/10.1117/12.2240109

KEYWORDS: Microscopes, X-rays, Optical design, Reflectivity, Spatial resolution, Grazing incidence, Multilayers, X-ray imaging, Mirrors, Spherical lenses

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Proceedings Article | 24 July 2014 Paper

Development of the x-ray timing and polarization telescope optics

Zhanshan Wang, Zhengxiang Shen, Baozhong Mu, Xin Wang, Xinyan Yang, Li Jiang, Runze Qi, Mingwu Wen, Zhong Zhang, Bin Ma

Proceedings Volume 9144, 91441E (2014) https://doi.org/10.1117/12.2055293

KEYWORDS: Glasses, X-rays, X-ray telescopes, Polarization, Epoxies, X-ray optics, Space telescopes, Multilayers, Reflectivity, Telescopes

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SPIE Journal Paper | 21 May 2014

Large-field high-resolution Kirkpatrick–Baez amélioré-Kirkpatrick–Baez mixed microscope for multi-keV time-resolved x-ray imaging diagnostics of laser plasma

Shengzhen Yi, Baozhong Mu, Xin Wang, Zhong Zhang, Jingtao Zhu, Zhanshan Wang, Pengfei He, Zhurong Cao, Jianjun Dong, Shenye Liu, Yongkun Ding

OE, Vol. 53, Issue 05, 053114, (May 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.5.053114

KEYWORDS: Microscopes, X-rays, Mirrors, X-ray imaging, Spatial resolution, Reflectivity, Multilayers, Diagnostics, Solids, Plasma

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Proceedings Article | 17 September 2012 Paper

Tolerance analysis on nested conical Wolter-I x-ray telescope

Baozhong Mu, Yichun Xie, Shenghao Chen, Shengzhen Yi, Xin Wang, Zhanshan Wang

Proceedings Volume 8443, 844340 (2012) https://doi.org/10.1117/12.925520

KEYWORDS: Tolerancing, Mirrors, Image quality, Spatial resolution, X-ray telescopes, Device simulation, Point spread functions, Sensors, Zernike polynomials, Optical alignment

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Proceedings Article | 5 May 2012 Paper

Nanoscale patterns made by using a 13.5-nm Schwarzschild objective and a laser produced plasma source

Zhanshan Wang, Xin Wang, Baozhong Mu, Yuhong Bai

Proceedings Volume 8430, 843012 (2012) https://doi.org/10.1117/12.923692

KEYWORDS: Mirrors, Laser induced fluorescence, Crystals, Extreme ultraviolet, Plasma, Luminescence, Monochromatic aberrations, Objectives, Image resolution, Microscopes

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Proceedings Article | 2 September 2010 Paper

Large-field high-energy KB microscope with aperiodic multilayer

Shengzhen Yi, Baozhong Mu, Zhanshan Wang, Xin Wang, Li Jiang, Jingtao Zhu

Proceedings Volume 7801, 78010C (2010) https://doi.org/10.1117/12.860271

KEYWORDS: Multilayers, X-rays, Microscopes, Mirrors, X-ray imaging, Reflectivity, Diagnostics, Fusion energy, Copper, Image resolution

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Proceedings Article | 25 August 2010 Paper

Study of 18.2-nm Schwarzschild microscope for plasma diagnostics

Xin Wang, Baozhong Mu, Yi Huang, Zirong Zhai, Shengzhen Yi, Li Jiang, Jingtao Zhu, Zhanshan Wang, Hongjie Liu, Leifeng Cao, Yuqiu Gu

Proceedings Volume 7801, 78010G (2010) https://doi.org/10.1117/12.860281

KEYWORDS: Microscopes, Mirrors, Spatial resolution, Plasma diagnostics, Reflectivity, Objectives, Multilayers, Plasma, Optical components, Copper

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Proceedings Article | 9 September 2009 Paper

1D-KBA microscope using double-periodic multilayer

Baozhong Mu, Zhanshan Wang, Shengzhen Yi, Jingtao Zhu, Xin Wang, Li Jiang, Qiushi Huang, Yuhong Bai

Proceedings Volume 7448, 74480K (2009) https://doi.org/10.1117/12.825767

KEYWORDS: Microscopes, X-rays, Mirrors, Diagnostics, Grazing incidence, X-ray imaging, Fusion energy, Reflectivity, Image resolution, Absorption

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Proceedings Article | 30 April 2009 Paper

Angle alignment method for soft x-ray using double-periodic multilayer

Baozhong Mu, Li Jiang, Shengzhen Yi, Jingtao Zhu, Xin Wang, Qiushi Huang, Moyan Tan, Xiaoqiang Wang, Jing Xu, Youwei Yao, Yi Huang, Hongying Liu, Zhanshan Wang, Lingyan Chen

Proceedings Volume 7360, 73600M (2009) https://doi.org/10.1117/12.820554

KEYWORDS: X-rays, Microscopes, X-ray imaging, Reflectivity, Grazing incidence, X-ray optics, Diagnostics, Zemax, Mirrors, Geometrical optics

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Proceedings Article | 30 April 2009 Paper

An auxiliary visible imaging method for alignment of x-ray Kirkpatrick-Baez optics

Baozhong Mu, Shengzhen Yi, Jingtao Zhu, Jing Xu, Xin Wang, Shengling Huang, Moyan Tan, Qiushi Huang, Liang Bai, Xiaoqiang Wang, Yi Huang, Li Jiang, Hongying Liu, Zhanshan Wang, Lingyan Chen, Yongkun Ding, Wenyong Miao, Jianjun Dong

Proceedings Volume 7360, 73600V (2009) https://doi.org/10.1117/12.820558

KEYWORDS: X-ray optics, X-ray imaging, X-rays, Imaging systems, Optical alignment, Mirrors, Microscopes, Grazing incidence, Lens design, Diagnostics

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Showing 5 of 17 publications

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