CONFERENCE PROCEEDINGS
Advanced Search
Ying Yuan
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 7 October 2020 Paper
Design of wide field of view pinhole lens for VR/AR image quality test
Proceedings Volume 11571, 115710F (2020) https://doi.org/10.1117/12.2579784
KEYWORDS: Distortion, Imaging systems, Tolerancing, Lens design, Coded apertures, Virtual reality, Augmented reality, Sensors, Monochromatic aberrations
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top