Ziyad Elalamy
R& D Engineer at Institut Fresnel
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 February 2004 Paper
Ziyad Elalamy, Emmanuel Drouard, Ludovic Escoubas, Francois Flory, Teresa Mc. Govern, Jean-Jacques Simon
Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.512716
KEYWORDS: Refractive index, Sol-gels, Thin films, Polarization, Refraction, Silica, Silicon, Prisms, Thin film deposition, Temperature metrology

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