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1 January 2010 Quantum-limited metrology with nonlinear detection schemes
Alfredo Luis
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SPIE Reviews, Vol. 1, Issue 1, 018006 (January 2010). https://doi.org/10.1117/6.0000007
Abstract
Quantum mechanics limit the resolution of detection schemes. Typical arrangements are based on linear processes, so that the corresponding quantum limits are usually understood as unsurpassable and ultimate. Recently it has been shown that nonlinear schemes allow signal detection and measurement with larger resolution than linear processes. In particular, this affects the quantum limits. We review the proposals introduced so far in this novel area of quantum metrology.
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Alfredo Luis "Quantum-limited metrology with nonlinear detection schemes," SPIE Reviews 1(1), 018006 (1 January 2010). https://doi.org/10.1117/6.0000007
Published: 1 January 2010
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Cited by 9 scholarly publications.
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KEYWORDS
Particles
Metrology
Nonlinear optics
Chemical species
Signal detection
Quantum physics
Signal to noise ratio
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