Paper
5 October 2012 Chemically induced electric field: flat band potential engineering
T. Bak, Z. Guo, W. Li, A.J. Atanacio, J. Nowotny
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Abstract
The present work considers engineering of the flat band potential, FBP, of metal oxides in a controlled manner. The aim is to minimise the energy losses related to recombination. The related experimental approaches include imposition of a chemically-induced electric field using the phenomena of segregation, diffusion and the formation of multilayer systems. This paper considers several basic phenomena that allow the modification of the surface charge and the space charge at the gas/solid and solid/liquid interfaces.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Bak, Z. Guo, W. Li, A.J. Atanacio, and J. Nowotny "Chemically induced electric field: flat band potential engineering", Proc. SPIE 8469, Solar Hydrogen and Nanotechnology VII, 84690Q (5 October 2012); https://doi.org/10.1117/12.927749
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Cited by 1 scholarly publication.
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KEYWORDS
Interfaces

Oxides

Diffusion

Solar energy

N-type semiconductors

Oxygen

Electrons

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