Dr. Srividya Revuru
at Univ at Albany
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 April 2009 Paper
Proceedings Volume 7273, 72733Q (2009) https://doi.org/10.1117/12.814308
KEYWORDS: Amplifiers, Line edge roughness, Lithography, Extreme ultraviolet lithography, Molecules, Oxygen, Thermal modeling, Thermodynamics, Photoresist materials, Polymers

Proceedings Article | 15 April 2008 Paper
Seth Kruger, Srividya Revuru, Shao-Zhong Zhang, Dimitri Vaughn, Eric Block, Paul Zimmerman, Robert Brainard
Proceedings Volume 6923, 69231O (2008) https://doi.org/10.1117/12.772994
KEYWORDS: Absorbance, Refractive index, Water, Sulfur, Oxygen, Refraction, Liquids, Argon, Potassium, Lithography

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