Radiometrically accurate simulation of InfraRed (IR) signatures is an essential prerequisite for valid IR sensor testing
within the IR Scene Projection (IRSP) community. The Electronic Combat Stimulation (ECSTIM) Branch EO/IR
Laboratory at the NAVAIR Air Combat Environment T&E Facility (ACETEF), NAWC-AD, Patuxent River, Maryland
has recently begun validation testing of their Large Format Resistive-emitter Array (LFRA) IRSP. This is in preparation
for developmental and operational testing of emerging mission-critical IR Countermeasure (IRCM) systems. Validation
is guided by the Navy Air Defense Threat Simulator Validation Procedures Manual (NAWCWPNS TM 7489-3) and will
support s other emerging high priority development programs such as the Joint Distributed IRCM Ground-test System
(JDIGS). This paper discusses the ECSTIM/EO/IR Laboratory LFRA IRSP validation testing process, the resulting data
collection, measurements and analysis.
MIRAGE WF is the latest high definition version of the MIRAGE infrared scene projector product line from Santa
Barbara Infrared Inc. (SBIR). MIRAGE WF is being developed under the Wide Format Resistive Array (WFRA)
program. The WFRA development is one of several efforts within the Infrared Sensor Simulator - Preplanned Product
Improvement (IRSS P3I) umbrella funded by the Central Test and Evaluation Investment Program (CTEIP) and led by
the US Navy at Patuxent River, MD. Three MIRAGE WF infrared scene projection systems are being delivered as part
of the WFRA program. The main differences between the MIRAGE XL (1024x1024) and MIRAGE WF are a 1536x768
emitter array and 100Hz true raster capability. The key emitter requirements that have been measured and will be
discussed include: Operability, Maximum Apparent Temperature, Rise Time and Array Uniformity. Key System
specifications are: 1536x768 pixels, maximum apparent temperature of 600K, maximum frame rate of 100Hz, raster and
snap shot updating, radiance rise and fall time less than 5 ms and windowed mode (1024x768) operation at up to 200 Hz.
Conference Committee Involvement (5)
Technologies for Synthetic Environments: Hardware-in-the-Loop XVIII
2 May 2013 | Baltimore, Maryland, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop XVII
25 April 2012 | Baltimore, Maryland, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop XVI
27 April 2011 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
7 April 2010 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV
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