Dr. David Gopinath Profile

Dr. David Gopinath

at XCAM Ltd.

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 21 August 2024 Poster + Paper

Characterizing x-ray optics for OGRE and its Pathfinder mission

Alexandra Higley, Jake McCoy, Randall McEntaffer, Bridget O'Meara, James Tutt, Vadim Burwitz, Gisela Hartner, Andreas Langmeier, Thomas Müller, Surangkhana Rukdee, Thomas Schmidt, Andrew Holland, Daniel Evan, Karen Holland, David Colebrook, David Gopinath, Casey DeRoo

Proceedings Volume 13093, 1309351 (2024) https://doi.org/10.1117/12.3018456

KEYWORDS: Reflection gratings, X-rays, Optical gratings, Spectroscopy, Silicon, Blazed gratings, Spectral resolution, Diffraction gratings, Point spread functions, Telescopes

Read Abstract +

Proceedings Article | 29 August 2022 Presentation + Paper

The focal plane camera for the Off-plane Grating Rocket Experiment

Daniel A. Evan, Andrew Holland, James Endicott, Karen Holland, David Gopinath, James Tutt, Randall McEntaffer

Proceedings Volume 12191, 1219115 (2022) https://doi.org/10.1117/12.2637135

KEYWORDS: Sensors, X-rays, X-ray detectors, Diffraction, Cameras, Electron multiplying charge coupled devices, Rockets, X-ray diffraction, Diffraction gratings, Charge-coupled devices

Read Abstract +

Proceedings Article | 13 December 2020 Presentation + Paper

X-ray analysis of the EMCCD point-source response

S. Hall, I. Kotov, D. Gopinath, A. Barbour, J. Li, Y. Gu, K. Holland, A. Holland, I. Jarrige, J. Pelliciari, M. Soman, S. Wilkins, V. Bisogni

Proceedings Volume 11454, 114541U (2020) https://doi.org/10.1117/12.2575012

KEYWORDS: X-rays, Electron multiplying charge coupled devices, Sensors, X-ray detectors, Spectroscopy, Diagnostics, Laser scattering, Scattering, Spectral resolution, Silicon

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years