Prof. Eric Pairel
at Univ. de Savoie
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 July 2019 Paper
P. Nagorny, T. Lacombe, T. Muller, H. Favreliere, E. Pairel, M. Pillet
Proceedings Volume 11172, 1117217 (2019) https://doi.org/10.1117/12.2522062
KEYWORDS: Polarization, Polarimetry, Machine learning, Sensors, Manufacturing, Feature extraction, Cameras, Defect detection, Control systems, Quality measurement, Defect inspection, Convolutional neural networks, Neural networks, Polarimetric sensing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top