Prof. Florian Meirer Profile

Prof. Florian Meirer

at Utrecht Univ

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Publications (1)

Proceedings Article | 9 September 2019 Presentation + Paper

Full-field hard X-ray microscopy based on aberration-corrected Be CRLs

Andreas Schropp, Dennis Brückner, Jessica Bulda, Gerald Falkenberg, Jan Garrevoet, Johannes Hagemann, Frank Seiboth, Kathryn Spiers, Frieder Koch, Christian David, Marianna Gambino, Martin Veselý, Florian Meirer, Christian Schroer

Proceedings Volume 11112, 1111208 (2019) https://doi.org/10.1117/12.2528422

KEYWORDS: Beryllium, X-rays, X-ray microscopy, Microscopy, X-ray optics, Tomography, Hard x-rays, Spatial resolution, Lenses

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