Dr. Haowei Yang Profile

Dr. Haowei Yang

at China Academy of Engineering Physics

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Publications (2)

Proceedings Article | 20 November 2024 Poster + Paper

Film thickness measurement by fitting extreme points of the normal spectral reflectance

Jiao Bai, Huaming Chen, Junguang Chen, Haowei Yang

Proceedings Volume 13241, 132411D (2024) https://doi.org/10.1117/12.3034873

KEYWORDS: Film thickness, Reflectivity, Refractive index, Reflection, Reflectance spectroscopy, Spectroscopy, Genetic algorithms

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Proceedings Article | 27 November 2023 Poster + Paper

Thin-film thickness measurement with normal spectral reflectance

Jiao Bai, Haowei Yang, Junguang Chen, Yinke Liu, Jiangfeng Song, Yan Shi

Proceedings Volume 12771, 1277117 (2023) https://doi.org/10.1117/12.2684208

KEYWORDS: Film thickness, Reflectivity, Reflection, Thin films, Objectives, Silica, Genetic algorithms, Spectroscopy, Refractive index, Incident light

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