In this study, multilayered PbZrxTi1-xO3 (PZT) samples were produced by tape-casting and subsequent sintering at temperatures in the range of 1175 °C to 1325 °C. Sintering times were 6 minutes and 24 minutes. Samples were poled and also electrically fatigued by long-term exposure (≈106 cycles) to cyclic electric fields. The parameters of initial and remnant polarization were estimated from hysteresis loops. Changes in the crystallographic microstructure as a function of sintering temperature TS and sintering time were examined by scanning electron microscopy (SEM) and X-ray diffraction (XRD) to gain insight on fatigue mechanisms and their prevention. The microstructural results, such as domain reorientation and amount of secondary phases, explained the results of electrical observations. We found that grain sizes and internal strains were major influence factors on device performance. Domain sizes were about two orders of magnitude smaller than grain sizes. Therefore, domain-grain wall interaction did not influence domain switching. Domain wall movement was facilitated in samples processed at TS less than 1250 °C, and such samples were more resistant to electrical fatigue. Samples degraded faster at TS above 1250 °C, but here a higher device performance power was found due to an increased unit cell tetragonality that yielded higher polarization values.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.