Jie Bai
at National Institute of Metrology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 7 March 2019 Paper
Proceedings Volume 11053, 110534F (2019) https://doi.org/10.1117/12.2513377
KEYWORDS: Sensors, Global Positioning System, Doppler effect, Radar, Radar sensor technology, Roads, Metrology, Calibration, Standards development, Legal

Proceedings Article | 7 March 2019 Paper
Proceedings Volume 11053, 110534E (2019) https://doi.org/10.1117/12.2513376
KEYWORDS: Sensors, Radar, 3D imaging standards, Error analysis, Metrology, Roads, Photography, 3D acquisition, Signal processing, Radar signal processing

Proceedings Article | 7 March 2019 Paper
Qiao Sun, Jie Bai, Lei Du, Zhe Fan, Hongbo Hu
Proceedings Volume 11053, 110530U (2019) https://doi.org/10.1117/12.2517180
KEYWORDS: Calibration, Control systems, Standards development, Field programmable gate arrays, Process control, Metrology, Scientific research, Sensors

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