Dr. Keith Sheach
at Sanmina Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 28 July 1994 Paper
Jonathan Milward, Keith Lewis, K. Sheach, Rudolf Heinecke
Proceedings Volume 2114, (1994) https://doi.org/10.1117/12.180925
KEYWORDS: Coating, Laser damage threshold, Microlens, Silicon, Reflectors, Semiconductor lasers, Laser induced damage, Absorption, Particles, Surface roughness

Proceedings Article | 24 June 1993 Paper
Jonathan Milward, Keith Lewis, K. Sheach, Rudolf Heinecke
Proceedings Volume 1848, (1993) https://doi.org/10.1117/12.147431
KEYWORDS: Coating, Laser damage threshold, Laser induced damage, Microlens, Silicon, Absorption, Reflectors, Reflectivity, Semiconductor lasers, Surface roughness

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