Kyo Otsubo
at Toshiba Materials Co Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 19 May 2008 Paper
Haruko Akutsu, Shinji Yamaguchi, Kyo Otsubo, Makiko Tamaoki, Ayako Shimazaki, Reiko Yoshimura, Fumihiko Aiga, Tsukasa Tada
Proceedings Volume 7028, 702829 (2008) https://doi.org/10.1117/12.793083
KEYWORDS: Air contamination, Photomasks, Raman spectroscopy, Molybdenum, Particles, Chemical analysis, Quartz, Ions, Testing and analysis, Scanning electron microscopy

Proceedings Article | 19 May 2008 Paper
Kenji Masui, Tetsuo Takemoto, Kyo Otsubo, Mari Sakai, Tomotaka Higaki, Hidehiro Watanabe, Tsutomu Kikuchi, Yoshiaki Kurokawa
Proceedings Volume 7028, 702809 (2008) https://doi.org/10.1117/12.793018
KEYWORDS: Particles, Photomasks, Mask cleaning, Liquids, Mechatronics, Velocity measurements, Phase measurement, Cavitation, Quartz

Proceedings Article | 11 May 2007 Paper
Kyo Otsubo, Shinji Yamaguchi, Yukiyasu Arisawa, Hidefumi Mukai, Toshiya Kotani, Hiromitsu Mashita, Hiromitsu Hashimoto, Takashi Kamo, Tomohiro Tsutsui, Osamu Ikenaga
Proceedings Volume 6607, 660708 (2007) https://doi.org/10.1117/12.728921
KEYWORDS: Photomasks, Lithography, Air contamination, Transmittance, Semiconducting wafers, Critical dimension metrology, Semiconductors, Computer simulations, Scanning electron microscopy, Manufacturing

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