CONFERENCE PROCEEDINGS
Advanced Search
Li Rao
PhD Student at Southeast Univ
SPIE Involvement:
Author
Publications (5)
SPIE Journal Paper | 17 June 2019
Camera calibration of a near-parallel imaging system based on magnification rate
Xiufu Zhang, Feipeng Da, Dongliang Zheng, Li Rao
OE, Vol. 58, Issue 06, 064104, (June 2019) https://doi.org/10.1117/12.10.1117/1.OE.58.6.064104
KEYWORDS: Calibration, Cameras, Imaging systems, Microscopes, Error analysis, Optical engineering, Distortion, Adaptive optics, Projection systems, Lithium
SPIE Journal Paper | 30 January 2019
Robust calibration method for microscopic vision systems
Li Rao, Feipeng Da
OE, Vol. 58, Issue 01, 014108, (January 2019) https://doi.org/10.1117/12.10.1117/1.OE.58.1.014108
KEYWORDS: Calibration, Cameras, Microscopes, Imaging systems, Sensors, Distortion, Image processing, Condition numbers, Optical engineering, Systems modeling
Proceedings Article | 24 July 2018 Paper
Phase error correction method for fringe projection profilometry systems while considering random noises and objects' reflectivity
Li Rao, Feipeng Da
Proceedings Volume 10827, 1082702 (2018) https://doi.org/10.1117/12.2326933
KEYWORDS: Phase shift keying, Reflectivity, Error analysis, Modulation, Fringe analysis, Cameras, Digital cameras, High dynamic range imaging, Signal to noise ratio, Imaging systems
SPIE Journal Paper | 21 September 2017
Adaptive fringe projection technique for high-dynamic range three-dimensional shape measurement using binary search
Shaoxu Li, Feipeng Da, Li Rao
OE, Vol. 56, Issue 09, 094111, (September 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.9.094111
KEYWORDS: Fringe analysis, Cameras, High dynamic range imaging, Projection systems, Binary data, 3D metrology, Phase shifts, Image processing, Reflectivity, Signal to noise ratio
Proceedings Article | 13 June 2017 Paper
Novel adaptive fringe projection technique for high dynamic range 3D shape measurement
Shaoxu Li, Feipeng Da, Li Rao
Proceedings Volume 10449, 104491I (2017) https://doi.org/10.1117/12.2270698
KEYWORDS: 3D metrology, Phase measurement, High dynamic range imaging, Cameras, 3D displays, Digital cameras, Phase shifts, Projection systems, 3D image processing
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top