Mo Neak
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 August 2024 Poster + Paper
Eric Miller, James Gregory, Marshall Bautz, Harry Clark, Michael Cooper, Kevan Donlon, Richard Foster, Catherine Grant, Mallory Jensen, Beverly LaMarr, Renee Lambert, Christopher Leitz, Andrew Malonis, Mo Neak, Gregory Prigozhin, Kevin Ryu, Benjamin Schneider, Keith Warner, Douglas Young, William Zhang
Proceedings Volume 13093, 130935P (2024) https://doi.org/10.1117/12.3018475
KEYWORDS: Charge-coupled devices, Semiconducting wafers, Silicon, Sensors, X-rays, Wafer bonding, Vacuum, CCD image sensors, Deformation, X-ray detectors

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