Prof. Mohammed Hassan Profile

Prof. Mohammed Hassan

Assistant Professor at Univ of Arizona

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 3 September 2018 Paper

Attomicroscopy: attosecond electron microscopy

M. Th. Hassan

Proceedings Volume 10753, 107530R (2018) https://doi.org/10.1117/12.2309426

KEYWORDS: Femtosecond phenomena, Electron microscopy, Ultrafast imaging, Ultrafast phenomena, Attosecond phenomena, Microscopy, 4D image capture, Ultrafast lasers, Ultrashort pulse metrology

Read Abstract +

The development of Ultrafast Electron Microscopy (UEM) and diffraction (UED) permit the imaging of atomic motion in real time and space. UEM and UED have found a vast range of applications spans chemistry, physics, material science, and biology. The temporal resolution in ultrafast electron imaging, typically on the order of few hundred femtoseconds, is limited by the electron pulse duration and the space charge effect. Hence, imaging the fast motions of electrons remains beyond the reach. Recently, we break the temporal resolution limits in UEM by generating a 30-fs electron pulse exploiting the optical gating approach. The gating technique is based on the electron-laser coupling where the free electrons in the wavepacket exchange energy with the light photons of the laser pulse. In this case, the optical laser pulse acts as a temporal gating for the electrons which gain/loss energy. These electrons are filtered out and generate an electron pulse with a temporal profile similar to the gating laser pulse. The obtained, few tens of femtosecond, temporal resolution opens the door- for the first time- to image the electron dynamics in real time. Moreover, the optical attosecond pulse, which has been demonstrated earlier, eventually will be used to gate the electrons in a sub-femtosecond time window. So, the gated electrons will generate a single isolated attosecond electron pulse. This unique tool will establish the attosecond electron imaging tool which we so-called "Attomicroscopy". Attomicroscopy will enable the imaging of the electron motion, last few hundreds of attosecond to few femtoseconds, in action.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years