Dr. Myriam Zerrad
Research Engineer at Institut Fresnel
SPIE Involvement:
Author
Publications (58)

Proceedings Article | 24 June 2024 Presentation + Paper
Proceedings Volume 13020, 130200N (2024) https://doi.org/10.1117/12.3022925
KEYWORDS: Light scattering, Equipment, Contamination, Optical surfaces, Scattered light, Scatterometry, Metrology, Scattering, Scatter measurement

Proceedings Article | 24 June 2024 Presentation + Paper
François Thullier, Myriam Zerrad, Claude Amra, Hélène Krol
Proceedings Volume 13020, 130200A (2024) https://doi.org/10.1117/12.3017381
KEYWORDS: Thin films, Thermography, Monolayers, Metrology, Laser radiation, Sensors, Pulse signals, Inverse optics, Infrared detectors, Silicon

Proceedings Article | 18 June 2024 Presentation
Paul Rouquette, Claude Amra, François Thullier, Gabriel Soriano, Michel Lequime, Helene Krol, Myriam Zerrad
Proceedings Volume PC13020, PC130200B (2024) https://doi.org/10.1117/12.3023029
KEYWORDS: Inverse optics, Optical coatings, Thermal modeling, Multilayers, Thermography, Systems modeling, Optical properties, Thin films, Tunable filters, Optical gratings

Proceedings Article | 18 June 2024 Presentation
Proceedings Volume PC12994, PC129940F (2024) https://doi.org/10.1117/12.3017397
KEYWORDS: Terahertz radiation, Nondestructive evaluation, Reflection, Terahertz sources, Spectroscopy, Silicon, Semiconducting wafers, Scattering, Millimeter wave sensors, Inverse problems

Proceedings Article | 18 June 2024 Presentation
Proceedings Volume PC13020, PC130200T (2024) https://doi.org/10.1117/12.3025131
KEYWORDS: Optical coatings, Light scattering, Equipment, Tunable filters, Optical testing, Optical filters, Metrology, Linear filtering

Showing 5 of 58 publications
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