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Prof. Olivier N. Pierron
Assistant Professor at Georgia Institute of Technology
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 3 October 2022 Presentation
Elastomeric photodetectors enabled by bulk heterojunction with skin-like mechanical properties (Conference Presentation)
Proceedings Volume PC12210, PC1221009 (2022) https://doi.org/10.1117/12.2632816
KEYWORDS: Photodetectors, Heterojunctions, Semiconductors, Polymers, Optoelectronic devices, Intelligence systems, Transistors, Tissues, Thin films, Skin
Proceedings Article | 9 February 2009 Paper
Low-cycle fatigue testing of silicon resonators
Pierre-Olivier Theillet, Olivier Pierron
Proceedings Volume 7206, 72060B (2009) https://doi.org/10.1117/12.808180
KEYWORDS: Resonators, Silicon, Silicon films, Microelectromechanical systems, 3D modeling, Reliability, Oscillators, Optical amplifiers, Capacitance, Optical calibration
Proceedings Article | 6 January 2006 Paper
Fatigue of polycrystalline silicon films with thin surface oxides
Proceedings Volume 6111, 611106 (2006) https://doi.org/10.1117/12.646468
KEYWORDS: Silicon films, Oxides, Silicon, Microelectromechanical systems, Resonators, Scanning electron microscopy, Photomicroscopy, Humidity, Silica, Oxidation
Proceedings Article | 22 January 2005 Paper
Long-term reliability of single-crystal silicon thin films: the influence of environment on the fatigue damage accumulation rate
Proceedings Volume 5716, (2005) https://doi.org/10.1117/12.591219
KEYWORDS: Silicon films, Humidity, Silicon, Reliability, Microelectromechanical systems, Oxides, Protactinium, Beam shaping, Photomicroscopy, Oxidation
Proceedings Article | 23 December 2003 Paper
Reaction-layer fatigue: understanding the limitations of structural silicon
Proceedings Volume 5343, (2003) https://doi.org/10.1117/12.527465
KEYWORDS: Silicon, Silicon films, Oxides, Interfaces, Thin films, Crystals, Failure analysis, Microelectromechanical systems, Mechanics, Oxidation
Conference Committee Involvement (5)
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
24 January 2011 | San Francisco, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX
25 January 2010 | San Francisco, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
28 January 2009 | San Jose, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
21 January 2008 | San Jose, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
23 January 2007 | San Jose, California, United States
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