Ruixuan Wu
at Institute of Microelectronics of the CAS
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 September 2020 Poster + Paper
Proceedings Volume 11517, 115171B (2020) https://doi.org/10.1117/12.2573145
KEYWORDS: Extreme ultraviolet lithography, Lithography, Nanoimprint lithography, Computational lithography, Source mask optimization, Deep ultraviolet, Manufacturing, Photomasks, Optimization (mathematics)

Proceedings Article | 26 September 2019 Paper
Proceedings Volume 11147, 111471U (2019) https://doi.org/10.1117/12.2536796
KEYWORDS: Photomasks, Lithography, Genetic algorithms, Extreme ultraviolet, Extreme ultraviolet lithography, Detection and tracking algorithms, Image quality, Manufacturing, High volume manufacturing, Optical proximity correction

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