Dr. Sumy Jose
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 February 2021 Presentation
Proceedings Volume 11614, 116140K (2021) https://doi.org/10.1117/12.2583827
KEYWORDS: Reliability, Dielectrics, System on a chip, Semiconductors, Metals, Electrical breakdown

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top