Plasma-induced damage to low-k dielectric materials can be quantified by separation of the effects of charged-particle
bombardment, photon bombardment, and gas-radical flux. For ion and photon bombardment, the spatial location and
extent of the damage can be determined. Damage effects from radical flux will be shown to be small. Both SiCOH and
photo-programmable low-k (PPLK) dielectrics will be discussed.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.